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EDS1232AATA-75MI View Datasheet(PDF) - Elpida Memory, Inc

Part Name
Description
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EDS1232AATA-75MI
Elpida
Elpida Memory, Inc Elpida
EDS1232AATA-75MI Datasheet PDF : 53 Pages
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EDS1232AATA-MI
DC Characteristics 1 (TA = –40 to +85°C, VDD, VDDQ = 3.3V±0.3V, VSS, VSSQ = 0V)
Parameter
/CAS latency
Symbol Grade max.
Unit
Test condition
Notes
Operating current
(CL = 2)
IDD1
105
mA
Burst length = 1
tRC tRC (min.)
1
IO = 0mA
(CL = 3)
IDD1
105
mA
One bank active
Standby current in power down IDD2P
1
Standby current in power down
(input signal stable)
IDD2PS
1
mA
CKE VIL (max.) tCK = 15ns
mA
CKE VIL (max.) tCK =
Standby current in non power
Edown
IDD2N
20
CKE VIH (min.) tCK = 15ns
mA
CS VIH (min.)
Input signals are changed one
time during 30ns
Standby current in non power
down
IDD2NS
8
(input signal stable)
mA
CKE VIH (min.) tCK =
Active standby current in power
Odown
IDD3P
5
mA
CKE VIL (max.) tCK = 15ns
Active standby current in power
down (input signal stable)
IDD3PS
4
mA
CKE VIL (max.), tCK =
Active standby current in non
L power down
IDD3N
25
CKE VIH (min.), tCK = 15 ns,
mA
/CS VIH (min.),
Input signals are changed one
time during 30ns.
Active standby current in non
power down
IDD3NS
15
(input signal stable)
mA
CKE VIH (min.), tCK = ,
Burst operating current
IDD4
180
mA
tCK tCK (min.),
IO = 0mA, All banks active
2
P Refresh current
IDD5
210
mA
tRC tRC (min.)
3
Self refresh current
IDD6
0.8
mA
VIH VDD 0.2V,
VIL GND + 0.2V
Notes: 1. IDD1 depends on output loading and cycle rates. Specified values are obtained with the output open. In
r addition to this, IDD1 is measured condition that addresses are changed only one time during tCK (min.).
2. IDD4 depends on output loading and cycle rates. Specified values are obtained with the output open.
In addition to this, IDD4 is measured condition that addresses are changed only one time during tCK
o (min.).
3. IDD5 is measured on condition that addresses are changed only one time during tCK (min.).
d DC Characteristics 2 (TA = –40 to +85°C, VDD, VDDQ = 3.3V±0.3V, VSS, VSSQ = 0V)
Parameter
Input leakage current
u Output leakage current
Output high voltage
ct Output low voltage
Symbol
min.
ILI
–1.0
ILO
–1.5
VOH
2.4
VOL
max.
1.0
1.5
0.4
Unit Test condition
Notes
µA
0 = VIN = VDDQ, VDDQ = VDD,
All other pins not under test = 0V
µA 0 = VIN = VDDQ DOUT is disabled
V
IOH = –2 mA
V
IOL = 2 mA
Data Sheet E0340E30 (Ver. 3.0)
5

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