HEF4015B View Datasheet(PDF) - NXP Semiconductors.
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Description
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HEF4015B Datasheet PDF : 15 Pages
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NXP Semiconductors
HEF4015B
Dual 4-bit static shift register
a. Input waveforms
VI
negative
pulse
0V
VI
positive
pulse
0V
90 %
10 %
VM
10 %
tf
tr
90 %
VM
tW
90 %
VM
10 %
tr
tf
90 %
VM
10 %
tW
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VDD
VI
G
VO
DUT
RT
CL
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b. Test circuit
Fig 7.
Test data is given in Table 10.
Definitions for test circuit:
DUT = Device Under Test;
CL = load capacitance including jig and probe capacitance;
RT = termination resistance should be equal to the output impedance Zo of the pulse generator.
Test circuit for measuring switching times
Table 10. Test data
Supply voltage
VDD
5 V to 15 V
Input
VI
VSS or VDD
tr, tf
20 ns
Load
CL
50 pF
HEF4015B
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 8 — 21 November 2011
© NXP B.V. 2011. All rights reserved.
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