PT6301
COMMAND WRITE METHOD AND DATA TRANSFER METHOD FOR
TEST MODE
BASIC FLOW FOR TEST MODE
Test flow is shown as the following chart.
Detailed data format for each test are explained in the following pages.
TEST MODE LIST
MSB
LSB
TEST Mode 1
1 0 0 0 0 0 0 1 Oscillation stop with all output “Low”
TEST Mode 2
1 0 0 0 0 0 1 0 Oscillation stop with all output “High”
TEST Mode 3
1 0 0 0 0 0 1 1 Driver circuit check mode
TEST Mode 4
1 0 0 0 0 1 0 0 DCRAM/ADRAM/DIGIT data output mode
TEST Mode 5
1 0 0 0 0 1 0 1 CGRAM/CGROM data output mode
TEST MODE 1. OSCILLATION STOP WITH ALL OUTPUT “LOW”
In this test, you can confirm that all the driver output signals are changed to “L”. Also, you can measure the static IDO and
static IDISP without oscillation.
COMMAND FORMAT
MSB
LSB
1st Byte
(1st)
B7 B6 B5 B4 B3 B2 B1 B0 Selects TEST Mode 1
1 0 0 0 0 001
STATUS OF OUTPUT SIGNALS
COM1 to 20: All “L”
ADA, ADB: All “L”
SEGA1 to 35, SEGB1 to 35: All “L”
DO: “L”
TEST FLOW
V1.2
17
March 2012