datasheetbank_Logo
数据手册搜索引擎和 Datasheet免费下载 PDF
HOME  >>>  Lattice Semiconductor  >>> ISPLSI3256A-70LQ PDF

ISPLSI3256A-70LQ 数据手册 ( 数据表 ) - Lattice Semiconductor

ISPLSI3256A image

零件编号
ISPLSI3256A-70LQ

Other PDF
  no available.

PDF
DOWNLOAD     

page
13 Pages

File Size
120.3 kB

生产厂家
Lattice
Lattice Semiconductor 

Description
The ispLSI 3256A is a High-Density Programmable Logic Device containing 384 Registers, 128 Universal I/O pins, five Dedicated Clock Input Pins, eight Output Routing Pools (ORP) and a Global Routing Pool (GRP) which allows complete inter-connectivity between all of these elements. The ispLSI 3256A features 5V in-system programmability and in-system diagnostic capabilities. The ispLSI 3256A offers non-volatile reprogrammability of the logic, as well as the interconnect to provide truly reconfigurable systems.
The basic unit of logic on the ispLSI 3256A device is the Twin Generic Logic Block (Twin GLB) labelled A0, A1...H3. There are a total of 32 Twin GLBs in the ispLSI 3256A device. Each Twin GLB has 24 inputs, a programmable AND array and two OR/Exclusive-OR Arrays, and eight outputs which can be configured to be either combinatorial or registered. All Twin GLB inputs come from the GRP.


FEATUREs
• HIGH-DENSITY PROGRAMMABLE LOGIC
   — 128 I/O Pins
   — 11000 PLD Gates
   — 384 Registers
   — High Speed Global Interconnect
   — Wide Input Gating for Fast Counters, State Machines, Address Decoders, etc.
   — Small Logic Block Size for Random Logic
• HIGH-PERFORMANCE E2CMOS® TECHNOLOGY
   — fmax = 90 MHz Maximum Operating Frequency
   — tpd = 12 ns Propagation Delay
   — TTL Compatible Inputs and Outputs
   — Electrically Erasable and Reprogrammable
   — Non-Volatile
   — 100% Tested at Time of Manufacture
   — Unused Product Term Shutdown Saves Power
• IN-SYSTEM PROGRAMMABLE
   — 5V In-System Programmable (ISP™) using Lattice ISP or Boundary Scan Test (IEEE 1149.1) Protocol
   — Increased Manufacturing Yields, Reduced Time-to Market, and Improved Product Quality
   — Reprogram Soldered Devices for Faster Debugging
• 100% IEEE 1149.1 BOUNDARY SCAN COMPATIBLE
• OFFERS THE EASE OF USE AND FAST SYSTEM SPEED OF PLDs WITH THE DENSITY AND FLEXIBILITY OF FIELD PROGRAMMABLE GATE ARRAYS
   — Complete Programmable Device Can Combine Glue Logic and Structured Designs
   — Enhanced Pin Locking Capability
   — Five Dedicated Clock Input Pins
   — Synchronous and Asynchronous Clocks
   — Programmable Output Slew Rate Control to Mini mize Switching Noise
   — Flexible Pin Placement
   — Optimized Global Routing Pool Provides Global Interconnectivity
• ispDesignEXPERT™ – LOGIC COMPILER AND COMPLETE ISP DEVICE DESIGN SYSTEMS FROM HDL SYNTHESIS THROUGH IN-SYSTEM PROGRAMMING
   — Superior Quality of Results
   — Tightly Integrated with Leading CAE Vendor Tools
   — Productivity Enhancing Timing Analyzer, Explore Tools, Timing Simulator and ispANALYZER™
   — PC and UNIX Platforms

Page Link's: 1  2  3  4  5  6  7  8  9  10  More Pages 

零件编号
产品描述 (功能)
视图
生产厂家
In-System Programmable High Density PLD ( Rev : 2002 )
PDF
Lattice Semiconductor
In-System Programmable High Density PLD
PDF
Lattice Semiconductor
In-System Programmable High Density PLD ( Rev : 2002 )
PDF
Lattice Semiconductor
In-System Programmable High Density PLD
PDF
Lattice Semiconductor
In-System Programmable High Density PLD
PDF
Lattice Semiconductor
In-System Programmable High Density PLD
PDF
Lattice Semiconductor
In-System Programmable High Density PLD
PDF
Lattice Semiconductor
In-System Programmable High Density PLD
PDF
Lattice Semiconductor
In-System Programmable High Density PLD
PDF
Lattice Semiconductor
In-System Programmable High Density PLD
PDF
Lattice Semiconductor

Share Link: GO URL

All Rights Reserved© datasheetbank.com  [ Privacy Policy ] [ Request Datasheet ] [ Contact Us ]