MC10E404, MC100E404
Table 8. AC CHARACTERISTICS (VCCx = 5.0 V; VEE = 0.0 V or VCCx = 0.0 V; VEE = −5.0 V (Note 1))
0°C
25°C
Symbol
Characteristic
Min Typ Max Min Typ Max Min
fMAX Maximum Toggle Frequency
900
900
TPLH
tPHL
Propagation Delay to Output
Da (Diff)
Da (SE)
Db (Diff)
Db (SE)
350 475 650 350 475 650 350
300 500 700 300 500 700 300
375 500 675 375 500 675 375
325
725 325
725 325
tSKEW Within-Device Skew (Note 2)
50
50
tJITTER Random Clock Jitter (RMS)
<1
<1
VPP(AC) Input Voltage Swing
150
150
150
(Differential Configuration)
85°C
Typ
900
475
500
500
50
<1
Max Unit
MHz
ps
650
700
675
725
ps
ps
mV
tTr
Rise/Fall Time
tf
(20 - 80%)
150
400 150
400 150
400 ps
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
1. 10 Series: VEE can vary −0.46 V / +0.06 V.
100 Series: VEE can vary −0.46 V / +0.8 V.
2. Within-device skew is defined as identical transitions on similar paths through a device.
Q
Driver
Device
Q
Zo = 50 W
Zo = 50 W
50 W
50 W
D
Receiver
Device
D
VTT
VTT = VCC − 2.0 V
Figure 3. Typical Termination for Output Driver and Device Evaluation
(See Application Note AND8020/D − Termination of ECL Logic Devices.)
Resource Reference of Application Notes
AN1405/D − ECL Clock Distribution Techniques
AN1406/D − Designing with PECL (ECL at +5.0 V)
AN1503/D − ECLinPSt I/O SPiCE Modeling Kit
AN1504/D − Metastability and the ECLinPS Family
AN1568/D − Interfacing Between LVDS and ECL
AN1672/D − The ECL Translator Guide
AND8001/D − Odd Number Counters Design
AND8002/D − Marking and Date Codes
AND8020/D − Termination of ECL Logic Devices
AND8066/D − Interfacing with ECLinPS
AND8090/D − AC Characteristics of ECL Devices
www.onsemi.com
5