MCP3304T 查看數據表（PDF） - Microchip Technology

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MCP3304T

13-Bit Differential Input, Low Power A/D Converter with SPI Serial Interface

Microchip Technology 

MCP3302/04

1.1 Test Circuits

1.4V

DOUT

3 kΩ

Test Point

CL = 100 pF

FIGURE 1-2:

Load Circuit for TR, TF, TDO.

Test Point

DOUT

VDD

3 kΩ

VDD/2 TDIS Waveform 2

TEN Waveform

100 pF

VSS

TDIS Waveform 1

Voltage Waveforms for TDIS

CS

VIH

DOUT

Waveform 1*

DOUT

Waveform 2†

TDIS

90%

10%

*Waveform 1 is for an output with internal

conditions such that the output is high, unless

disabled by the output control.

†Waveform 2 is for an output with internal

conditions such that the output is low, unless

disabled by the output control.

FIGURE 1-3:

TEN.

Load circuit for TDIS and

2.63V

1 k

20 kΩ

1/2 MCP602

+

- 1 k

5V ±500 mVP-P

To VDD on DUT

5VP-P 1 k

5VP-P

5VP-P

VREF = 5V

1 µF

0.1 µF

VDD = 5V

0.1 µF

IN(+)

VREFVDD

IN(-) MCP330X VSS

VCM = 2.5V

FIGURE 1-5:

Full Differential Test

Configuration Example.

5VP-P

VCM = 2.5V

VREF = 2.5V

1µF

0.1µF

VDD = 5V

0.1µF

IN(+)

VREFVDD

IN(-) MCP330X VSS

FIGURE 1-6:

Pseudo Differential Test

Configuration Example.

FIGURE 1-4:

Power Supply Sensitivity

Test Circuit (PSRR).

DS21697F-page 6

 2011 Microchip Technology Inc.

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