M48Z58, M48Z58Y
DC and AC parameters
Table 8. DC characteristics
Symbol
Parameter
Test condition(1)
Min
Max
ILI
ILO(2)
ICC
ICC1
ICC2
VIL
VIH
VOL
VOH
Input leakage current
Output leakage current
Supply current
Supply current (standby) TTL
Supply current (standby) CMOS
Input low voltage
Input high voltage
Output low voltage
Output high voltage
0V ≤ VIN ≤ VCC
0V ≤ VOUT ≤ VCC
Outputs open
E = VIH
E = VCC – 0.2V
IOL = 2.1mA
IOH = –1mA
±1
±1
50
3
3
–0.3
0.8
2.2
VCC + 0.3
0.4
2.4
1. Valid for ambient operating temperature: TA = 0 to 70°C; VCC = 4.75 to 5.5V or 4.5 to 5.5V (except where noted).
2. Outputs deselected.
Unit
µA
µA
mA
mA
mA
V
V
V
V
Figure 10. Power down/up mode AC waveforms
VCC
VPFD (max)
VPFD (min)
VSO
tF
tFB
tPD
INPUTS
RECOGNIZED
tRB
tDR
DON'T CARE
tR
trec
RECOGNIZED
OUTPUTS
VALID
(PER CONTROL INPUT)
HIGH-Z
VALID
(PER CONTROL INPUT)
AI01168C
Table 9. Power down/up AC characteristics
Symbol
Parameter(1)
Min
Max
Unit
tPD
E or W at VIH before power down
0
µs
tF(2)
VPFD (max) to VPFD (min) VCC fall time
300
µs
tFB(3)
VPFD (min) to VSS VCC fall time
10
µs
tR
VPFD (min) to VPFD (max) VCC rise time
10
µs
tRB
VSS to VPFD (min) VCC rise time
1
µs
trec
VPFD (max) to inputs recognized
40
200
ms
1. Valid for ambient operating temperature: TA = 0 to 70°C; VCC = 4.75 to 5.5V or 4.5 to 5.5V (except where noted).
2. VPFD (max) to VPFD (min) fall time of less than tF may result in deselection/write protection not occurring until 200µs after
VCC passes VPFD (min).
3. VPFD (min) to VSS fall time of less than tFB may cause corruption of RAM data.
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