SMP30-120(2000) 查看數據表（PDF） - STMicroelectronics
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SMP30-120 Datasheet PDF : 6 Pages
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SMP30-xxx Series
TEST CIRCUIT 2 for IH parameter.
R
VBAT = - 48 V
D.U.T.
- VP
Surge generator
This is a GO-NOGO Test which allows to confirm the holding current (IH) level in a functional test circuit.
TEST PROCEDURE :
n 1) Adjust the current level at the IH value by short circuiting the AK of the D.U.T.
2) Fire the D.U.T with a surge Current : Ipp = 10A , 10/1000 µs.
3) The D.U.T will come back off-state within 50 ms max.
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