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74LVC00ATTR(2004) 查看數據表(PDF) - STMicroelectronics

零件编号
产品描述 (功能)
生产厂家
74LVC00ATTR
(Rev.:2004)
ST-Microelectronics
STMicroelectronics 
74LVC00ATTR Datasheet PDF : 11 Pages
1 2 3 4 5 6 7 8 9 10
74LVC00A
Table 7: Dynamic Switching Characteristics
Test Condition
Value
Symbol
Parameter
VOLP
VOLV
Dynamic Low Level Quiet
Output (note 1)
VCC
TA = 25 °C
Unit
(V)
Min. Typ. Max.
3.3
CL = 50pF
VIL = 0V, VIH = 3.3V
0.8
-0.8
V
1) Number of output defined as "n". Measured with "n-1" outputs switching from HIGH to LOW or LOW to HIGH. The remaining output is
measured in the LOW state.
Table 8: AC Electrical Characteristics
) Test Condition
Value
uct(s Symbol
Parameter
VCC
CL
RL ts = tr -40 to 85 °C
-55 to 125 °C Unit
(V)
(pF) () (ns) Min. Max. Min. Max.
rod tPLH tPHL Propagation Delay 1.65 to 1.95 30 1000 2.0
9.0
Time
2.3 to 2.7 30 500 2.0
6.0
P 2.7
50 500 2.5
5.1
12
8.0
ns
6.1
te 3.0 to 3.6 50 500 2.5
1
4.3
1
5.1
le tOSLH
so tOSHL
Output To Output
Skew Time (note1,
2)
2.7 to 3.6
1
1
ns
b 1) Skew is defined as the absolute value of the difference between the actual propagation delay for any two outputs of the same device switch-
O ing in the same direction, either HIGH or LOW (tOSLH = | tPLHm - tPLHn|, tOSHL = | tPHLm - tPHLn|
- 2) Parameter guaranteed by design
t(s) Table 9: Capacitive Characteristics
duc Symbol
Parameter
Pro CIN Input Capacitance
te CPD Power Dissipation Capacitance
ole (note 1)
Test Condition
VCC
(V)
1.8
fIN = 10MHz
2.5
3.3
Value
TA = 25 °C
Unit
Min. Typ. Max.
4
pF
27
30
pF
33
bs 1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
O load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/n (per circuit)
4/11

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