EHP-A07-SUG01-P01 查看數據表（PDF） - EVERLIGHT
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EHP-A07-SUG01-P01 Datasheet PDF : 10 Pages
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EVERLIGHT ELECTRONICS CO.,LTD.
Reliability Test Items and Results
Stress Test
Stress Condition
Solderability
Reflow
Thermal Shock
Tsol=230℃, 5sec
Tsol=260℃, 10sec, 6min
H：＋110℃ 20min.
'∫ 10sec.
'L：－ 40℃ 20min.
Temperature Cycle
H：＋100℃ 30min.
'∫ 5min.
'L：－ 40℃ 30min.
EHP-A07/SUG01-P01
Stress Duration
1 times
3 times
500 Cycles
1000 Cycles
High Temperature/Humidity
Reverse Bias
Ta=85℃ , RH=85%
High Temperature Storage
Ta=110℃
Low Temperature Storage
Ta=-40℃
Intermittent operational Life
Ta=25℃, IF=1000mA
30mS on/ 2500mS off
High Temperature Operation
Life #1
High Temperature Operation
Life #2
Ta=55℃, IF=350mA
Ta=85℃, IF=225mA
High Temperature Operation
Life #3
Ta=100℃, IF=150mA
Low Temperature Operation
Life
Power Temperature Cycle
ESD Human Body Model
Ta=-40℃, IF=350mA
H：＋85℃ 15min.
'∫ 5min.
'L：－ 40℃ 15min.
IF=225mA,2min on/off
2000V, Interval:0.5sec
ESD Machine Model
200V, Interval:0.5sec
*lm: BRIGHTNESS ATTENUATE DIFFERENCE(1000hrs)＜50%
*VF: FORWARD VOLTAGE DIFFERENCE＜20%
1000hours
1000hours
1000hours
1000hours
1000hours
1000hours
1000hours
1000hours
1000cycles
3 times
3 times
Everlight Electronics Co., Ltd.
Device No. : DSE-7N1-001
http://www.everlight.com
Prepared date: Sep 10, 2006
Rev. 2.0
Page: 8 of10
Prepared by: Peggy Chen
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