HEF4047B 查看數據表（PDF） - NXP Semiconductors.

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HEF4047B

Monostable/astable multivibrator

NXP Semiconductors. 

NXP Semiconductors

HEF4047B

Monostable/astable multivibrator

11.1.2

Variations due to changes in VDD

In addition to variations from unit-to-unit, the astable period may vary as a function of

frequency with respect to VDD. Typical variations are presented graphically in Figure 7 and

Figure 8 with 10 V as a reference.



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(1) Tamb = 25 C; fo = 10 kHz; Ct = 100 pF; Rt = 220 k.

(2) Tamb = 25 C; fo = 5 kHz; Ct = 100 pF; Rt = 470 k.

(3) Tamb = 25 C; fo = 1 kHz; Ct = 1000 pF; Rt = 220 k.

Fig 7. Typical O and O period accuracy as a function of supply voltage; astable mode.



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DDD





HEF4047B

Product data sheet











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(1) Tamb = 25 C; fo = 500 kHz; Ct = 10 pF; Rt = 47 k.

(2) Tamb = 25 C; fo = 225 kHz; Ct = 100 pF; Rt = 10 k.

(3) Tamb = 25 C; fo = 100 kHz; Ct = 100 pF; Rt = 22 k.

(4) Tamb = 25 C; fo = 50 kHz; Ct = 100 pF; Rt = 47 k.

Fig 8. Typical O and O period accuracy as a function of supply voltage; astable mode.

All information provided in this document is subject to legal disclaimers.

Rev. 5 — 16 December 2015

© NXP Semiconductors N.V. 2015. All rights reserved.

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