NE1617ADS,112(2009) 查看數據表（PDF） - NXP Semiconductors.

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NE1617ADS,112
(Rev.:2009)

Temperature monitor for microprocessor systems

NXP Semiconductors. 

NXP Semiconductors

NE1617A

Temperature monitor for microprocessor systems

11.1 Typical performance curves

20

temp.

error

(°C)

10

D+ to GND

002aab749

6

temp.

error

(°C)

2

002aab747

0

−2

−10

D+ to VDD

−20

1

10

102

leakage resistance (MΩ)

−6

1

10

102

103

104

f (kHz)

Fig 6.

Temperature error versus printed-circuit board

leakage resistance

Fig 7.

VI = 100 mVpp and AC-coupled to D−

Temperature error versus common-mode

noise frequency

6

temp.

error

(°C)

2

002aab748

10

temp.

error

(°C)

0

002aab750

−2

−10

−6

1

10

102

103

104

f (kHz)

Fig 8.

VI = 100 mVpp and AC-coupled to D− and D+

Temperature error versus differential mode

noise frequency

−20

0

40

80

120

D+ to D− capacitance (nF)

Fig 9. Temperature error versus D+ to D−

capacitance

NE1617A_4

Product data sheet

Rev. 04 — 30 July 2009

© NXP B.V. 2009. All rights reserved.

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