74HCT175N 查看數據表（PDF） - NXP Semiconductors.
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74HCT175N Datasheet PDF : 19 Pages
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NXP Semiconductors
74HC175; 74HCT175
Quad D-type flip-flop with reset; positive-edge trigger
VI 90 %
negative
pulse
GND
VI
positive
pulse
10 %
GND
VM
10 %
tf
tr
90 %
VM
VI
G
RT
tW
tW
VCC
DUT
VM
tr
tf
VM
VO
CL
001aah768
Test data is given in Table 9.
Definitions for test circuit:
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
CL = Load capacitance including jig and probe capacitance.
RL = Load resistance.
Fig 11. Test circuit for measuring switching times
Table 9. Test data
Type
Input
74HC175
74HCT175
VI
tr, tf
VCC
6 ns
3V
6 ns
Load
CL
15 pF, 50 pF
15 pF, 50 pF
RL
1 k
1 k
Test
tPLH, tPHL
tPLH, tPHL
74HC_HCT175
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 4 — 8 April 2014
© NXP Semiconductors N.V. 2014. All rights reserved.
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