HEF4543B 查看數據表（PDF） - NXP Semiconductors.

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HEF4543B

BCD to 7-segment latch/decoder/driver

NXP Semiconductors. 

NXP Semiconductors

HEF4543B

BCD to 7-segment latch/decoder/driver

a. Input waveforms

VI 90 %

tW

negative

pulse

VM

10 %

0V

tf

VI

positive

pulse

tr

90 %

VM

10 %

0V

tW

VM

tr

tf

VM

001aaj781

VDD

VI

G

VO

DUT

RT

CL

001aag182

b. Test circuit

Fig 7.

Test data is given in Table 9.

Definitions for test circuit:

RL = Load resistance;

CL = Load capacitance including jig and probe capacitance;

RT = Termination resistance should be equal to output impedance Zo of the pulse generator.

Test circuit for switching times

Table 9. Test data

Supply voltage

5 V to 15 V

Input

VI

VDD

VM

0.5VI

13. Application information

tr, tf

≤ 20 ns

Some examples of applications for the HEF4543B are:

• Driving LCD displays

• Driving LED displays

• Driving fluorescent displays

• Driving incandescent displays

• Driving gas discharge displays

Load

CL

50 pF

HEF4543B_5

Product data sheet

Rev. 05 — 27 October 2009

© NXP B.V. 2009. All rights reserved.

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