SMJ4C1024
1048576 BY 1-BIT
DYNAMIC RANDOM-ACCESS MEMORY
SGMS023E – DECEMBER 1988 – REVISED MARCH 1996
PARAMETER MEASUREMENT INFORMATION
V
1.31 V
IOH / IOL
RL = 218 Ω
Output Under Test
CL = 80 pF
(see Note A)
Output Under Test
CL = 80 pF
(see Note A)
(a) LOAD CIRCUIT
(b) ALTERNATE LOAD CIRCUIT
NOTE A: CL includes probe and fixture capacitance.
Figure 1. Load Circuits for Timing Parameters
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