STGB18N40LZ(2008_03) 查看數據表（PDF） - STMicroelectronics

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STGB18N40LZ
(Rev.:2008_03)

EAS 180 mJ - 400 V - internally clamped IGBT

STMicroelectronics 

STGD18N40LZ - STGB18N40LZ

3

Test circuits

Figure 16. Test circuit for inductive load

switching

Test circuits

Figure 17. Gate charge test circuit

Figure 18. Switching waveform

Figure 19. Test circuit for resistive load

switching

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