THICK FILM CHIP RESISTORS
ELECTRICAL CHARACTERISTICS
Item
Specification
Low Temperature
exposure
△R : ±(3%+0.1Ω) of the initial value.
Visual : No evidence of mechanical damage.
Temperature Cycle
△R : ±(1%+0.1Ω) of the initial value.
Visual : No evidence of mechanical damage.
Load Life in
Moisture
At R 10Ω△R : ±5%
At R 1㏁△R : ±(3% + 0.1Ω)
At R 1㏁△R : ±5%
Visual : No evidence of mechanical damage.
Load Life in high
Temperature
At R 10Ω△R : ±5%
At R 1㏁△R : ±(3% + 0.1Ω)
At R 1㏁△R : ±5%
Heat Resistance
(High Temperature
Exposure)
△R : ±(3%+0.1Ω) of the initial value.
Visual : No evidence of mechanical damage.
Test Method
Dwell in -55℃ chamber without loading for 1000±12 hours
Dwell for 60 minutes at Room temperature and
Measure resistance value.
Perform 100Cycles as follows.
No. Temperature(℃)
1
-55±3
2
20±3
3
125±3
4
20±3
Time(min)
30
15
30
15
Temperature : 40±2℃
RH : 90~95%
Applying rated voltage for 90 minutes “ON” and
30minutes”OFF”
Duration : 1000 hours
Dwell in Room temperature for 1 hour and measure
resistance value.
Temperature : 70±3℃ at rated voltage.
Applying rated voltage for 90 minutes “ON” and
30minutes”OFF”
Duration : 1000 hours
Dwell in Room temperature for 1 hour and measure
resistance value.
Dwell in 125±3℃ chamber without loading for
1000±12 hours
Dwell in Room temperature for 1 hour and measure
resistance value.
13