STK14C88-3NF45I 查看數據表（PDF） - Cypress Semiconductor
零件编号
产品描述 (功能)
生产厂家
STK14C88-3NF45I Datasheet PDF : 17 Pages
| |||
STK14C88-3
AC Switching Characteristics
SRAM Read Cycle
Parameter
Cypress
Parameter
Alt
tACE
tRC [9]
tAA [10]
tDOE
tOHA [10]
tLZCE [11]
tHZCE [11]
tLZOE [11]
tHZOE [11]
tPU [8]
tPD [8]
tELQV
tAVAV, tELEH
tAVQV
tGLQV
tAXQX
tELQX
tEHQZ
tGLQX
tGHQZ
tELICCH
tEHICCL
Switching Waveforms
Description
Chip Enable Access Time
Read Cycle Time
Address Access Time
Output Enable to Data Valid
Output Hold After Address Change
Chip Enable to Output Active
Chip Disable to Output Inactive
Output Enable to Output Active
Output Disable to Output Inactive
Chip Enable to Power Active
Chip Disable to Power Standby
35 ns
Min
Max
35
35
35
15
5
5
13
0
13
0
35
Figure 7. SRAM Read Cycle 1: Address Controlled [9, 10]
W5&
$''5(66
W$$
W2+$
'4 '$7$287
'$7$9$/,'
45 ns
Unit
Min Max
45
ns
45
ns
45
ns
20
ns
5
ns
5
ns
15
ns
0
ns
15
ns
0
ns
45
ns
Figure 8. SRAM Read Cycle 2: CE and OE Controlled [9]
$''5(66
&(
2(
'4 '$7$287
W5&
W/=&(
W$&(
W'2(
W/=2(
W3'
W+=&(
W+=2(
'$7$9$/,'
W38
$&7,9(
,&&
67$1'%<
Notes
9. WE and HSB must be HIGH during SRAM Read Cycles.
10. I/O state assumes CE and OE < VIL and WE > VIH; device is continuously selected.
11. Measured ±200 mV from steady state output voltage.
Document Number: 001-50592 Rev. **
Page 9 of 17
[+] Feedback
Share Link: 