STK14C88-3NF45I 查看數據表（PDF） - Cypress Semiconductor
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STK14C88-3NF45I Datasheet PDF : 17 Pages
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STK14C88-3
Data Retention and Endurance
Parameter
DATAR
NVC
Description
Data Retention
Nonvolatile STORE Operations
Min
100
1,000
Capacitance
In the following table, the capacitance parameters are listed.[8]
Parameter
Description
Test Conditions
CIN
COUT
Input Capacitance
Output Capacitance
TA = 25°C, f = 1 MHz,
VCC = 0 to 3.0 V
Thermal Resistance
In the following table, the thermal resistance parameters are listed.[8]
Parameter
ΘJA
ΘJC
Description
Thermal Resistance
(Junction to Ambient)
Thermal Resistance
(Junction to Case)
Test Conditions
Test conditions follow standard test methods and
procedures for measuring thermal impedance, per
EIA / JESD51.
Max
5
7
32-SOIC
TBD
TBD
Unit
Years
K
Unit
pF
pF
32-PDIP
TBD
Unit
°C/W
TBD
°C/W
Figure 6. AC Test Loads
3.3V
R1 317Ω
Output
30 pF
R2
351Ω
AC Test Conditions
Input Pulse Levels .................................................. 0 V to 3 V
Input Rise and Fall Times (10% - 90%)........................ <5 ns
Input and Output Timing Reference Levels ................... 1.5 V
Note
8. These parameters are guaranteed by design and are not tested.
Document Number: 001-50592 Rev. **
Page 8 of 17
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