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MPC9230EI 查看數據表(PDF) - Integrated Device Technology

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产品描述 (功能)
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MPC9230EI
IDT
Integrated Device Technology 
MPC9230EI Datasheet PDF : 16 Pages
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MPC9230 Data Sheet
800MHZ LOW VOLTAGE PECL CLOCK SYNTHESIZER
Substituting N for the four available values for N (1, 2, 4, 8) yields:
Table 11. Output Frequency Range for fXTAL = 16 MHz
N
Output
Output
FOUT
1 0 Value
Frequency
Range for
Frequency
Range for
TA = 0°C to 70°C TA = –40°C to 85°C
FOUT
Step
00 2
M 200 – 400 MHz 200 – 375 MHz 1 MHz
0 1 4 M÷2 100 – 200 MHz 100 – 187.5 MHz 500 kHz
1 0 8 M÷4 50 – 100 MHz 50 – 93.75 MHz 250 kHz
1 1 1 2 M 400 – 800 MHz 400 – 750 MHz 2 MHz
Example Frequency Calculation for an 16 MHz Input Frequency
If an output frequency of 131 MHz was desired, the following
steps would be taken to identify the appropriate M and N values.
According to Table 11, 131 MHz falls in the frequency set by a value
of 4, so N[1:0] = 01. For N = 4, the output frequency is FOUT = M ÷
2 and M = FOUT x 2. Therefore M = 2 x 131 = 262, so M[8:0] =
010000011. Following this procedure a user can generate any whole
frequency between 50 MHz and 800 MHz. Note than for
N > 2 fractional values of can be realized. The size of the
programmable frequency steps (and thus the indicator of the
fractional output frequencies achievable) will be equal to:
fSTEP = fXTAL ÷ 8 ÷ N
APPLICATIONS INFORMATION
Using the Parallel and Serial Interface
The M and N counters can be loaded either through a parallel or
serial interface. The parallel interface is controlled via the P_LOAD
signal such that a LOW to HIGH transition will latch the information
present on the M[8:0] and N[1:0] inputs into the M and N counters.
When the P_LOAD signal is LOW, the input latches will be
transparent and any changes on the M[8:0] and N[1:0] inputs will
affect the FOUT output pair. To use the serial port, the S_CLOCK
signal samples the information on the S_DATA line and loads it into
a 14 bit shift register. Note that the P_LOAD signal must be HIGH for
the serial load operation to function. The Test register is loaded with
the first three bits, the N register with the next two and the M register
with the final eight bits of the data stream on the S_DATA input. For
each register the most significant bit is loaded first (T2, N1 and M8).
A pulse on the S_LOAD pin after the shift register is fully loaded will
transfer the divide values into the counters. The HIGH to LOW
transition on the S_LOAD input will latch the new divide values into
the counters. Figure 4 illustrates the timing diagram for both a
parallel and a serial load of the MPC9230 synthesizer. M[8:0] and
N[1:0] are normally specified once at power-up through the parallel
interface, and then possibly again through the serial interface. This
approach allows the application to come up at one frequency and
then change or fine-tune the clock as the ability to control the serial
interface becomes available.
Using the Test and Diagnosis Output TEST
The TEST output provides visibility for one of the several internal
nodes as determined by the T[2:0] bits in the serial configuration
stream. It is not configurable through the parallel interface. Although
it is possible to select the node that represents FOUT, the LVPECL
compatible TEST output is not able to toggle fast enough for higher
output frequencies and should only be used for test and diagnosis.
The T2, T1 and T0 control bits are preset to ‘000' when P_LOAD is
LOW so that the LVPECL compatible FOUT outputs are as jitter-free
as possible. Any active signal on the TEST output pin will have
detrimental affects on the jitter of the PECL output pair. In normal
operations, jitter specifications are only guaranteed if the TEST
output is static. The serial configuration port can be used to select
one of the alternate functions for this pin. Most of the signals
available on the TEST output pin are useful only for performance
verification of the MPC9230 itself; however, the PLL bypass mode
may be of interest at the board level for functional debug. When
T[2:0] is set to 110 the MPC9230 is placed in PLL bypass mode. In
this mode the S_CLOCK input is fed directly into the M and N
dividers. The N divider drives the FOUT differential pair and the M
counter drives the TEST output pin. In this mode the S_CLOCK
input could be used for low speed board level functional test or
debug. Bypassing the PLL and driving FOUT directly gives the user
more control on the test clocks sent through the clock tree. Table 12
shows the functional setup of the PLL bypass mode. Because the
S_CLOCK is a CMOS level, the input frequency is limited to 200
MHz. This means the fastest the FOUT pin can be toggled via the
S_CLOCK is 50 MHz as the divide ratio of the Post-PLL divider is 4
(if N = 1). Note that the M counter output on the TEST output will not
be a 50% duty cycle.
Table 12. Test and Debug Configuration for TEST
T[2:0]
T2 T1 T0
000
TEST Output
14-bit shift register out(1)
0 0 1 Logic 1
0
1
0 fXTAL ÷ 16
0 1 1 M-Counter out
1
0
0 FOUT
1 0 1 Logic 0
1 1 0 M-Counter out in PLL-bypass mode
1
1
1 FOUT ÷ 4
1. Clocked out at this rate of S_CLOCK.
Table 13. Debug Configuration for PLL Bypass(1)
Output
FOUT
TEST
Configuration
S_CLOCK ÷ N
M-Counter out(2)
1. T[2:0]=110. AC specifications do not apply in PLL bypass mode.
2. Clocked out at the rate of S_CLOCK÷(2N).
MPC9230 REVISION 8 MARCH 29, 2010
9
©2010 Integrated Device Technology, Inc.

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