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MC10141FN 查看數據表(PDF) - ON Semiconductor

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MC10141FN
ON-Semiconductor
ON Semiconductor 
MC10141FN Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
MC10141
ELECTRICAL CHARACTERISTICS (continued)
TEST VOLTAGE VALUES (Volts)
@ Test Temperature
–30°C
VIHmax
–0.890
VILmin
–1.890
VIHAmin
–1.205
VILAmax
–1.500
VEE
–5.2
+25°C –0.810 –1.850 –1.105 –1.475
–5.2
+85°C –0.700 –1.825 –1.035 –1.440
–5.2
Characteristic
Power Supply Drain Current
Input Current
Symbol
IE
IinH
Pin
Under
Test
8
5
6
7
4
TEST VOLTAGE APPLIED TO PINS LISTED BELOW
VIHmax
5
6
7
4
VILmin VIHAmin VILAmax
VEE
8
8
8
8
8
P1 P2 P3
(VCC)
Gnd
1, 16
1, 16
1, 16
1, 16
1, 16
4,5,6,7,9,
IinL
12
10,11,13
12
8
1, 16
Output Voltage
Logic 1 VOH
3
6
8
4
1, 16
Output Voltage
Logic 0 VOL
3
8
4
1, 16
Threshold Voltage Logic 1 VOHA
3
6
8
4
(Note 1.)
3
6
Note 3.
7
8
4
1, 16
1, 16
3
6
Note 3.
8
4
1, 16
3
8
4 1, 16
Threshold Voltage Logic 0 VOLA
3
(Note 1.)
3
3
3
Note 4.
Note 4.
6
6
8
4
1, 16
7
8
4
1, 16
8
4
1, 16
8
4 1, 16
Switching Times (50Load)
–3.2 V
+2.0 V
Propagation Delay
Setup TIme (tsetup)
Hold Time (thold)
Rise Time
(20 to 80%)
Fall Time
(20 to 80%)
Shift Frequency
t4+3+
t12+4+
t10+4+
t4+12+
t3+
t3–
fshift
3
14
14
14
3
3
Note 2.
1. These tests to be performed in sequence as shown. P1
2. See shift frequency test circuit for test procedures.
3. Reset to zero before performing test.
4. Reset to one before performing test.
VIH
P2
VIL
8
8
8
8
8
8
8
VIHA
P3
VIL
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
VILA
VIL
Each MECL 10,000 series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been
established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 linear fpm is maintained.
Outputs are terminated through a 50–ohm resistor to –2.0 volts. Test procedures are shown for only one gate. The other gates are tested in the
same manner.
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