74HC00-Q100 查看數據表（PDF） - NXP Semiconductors.

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74HC00-Q100

Quad 2-input NAND gate

NXP Semiconductors. 

Nexperia

74HC00-Q100; 74HCT00-Q100

Quad 2-input NAND gate

9, 

QHJDWLYH

SXOVH

*1'

9,

SRVLWLYH

SXOVH

*1' 

90



WI

WU



90

9,

*

57

W:

W:

9&&

'87

90

WU

WI

90

92

&/

DDK



Fig 7.

Test data is given in Table 9.

Definitions test circuit:

RT = termination resistance should be equal to output impedance Zo of the pulse generator.

CL = load capacitance including jig and probe capacitance.

Test circuit for measuring switching times

Table 9. Test data

Type

74HC00-Q100

74HCT00-Q100

Input

VI

VCC

3.0 V

tr, tf

6.0 ns

6.0 ns

Load

CL

15 pF, 50 pF

15 pF, 50 pF

Test

tPLH, tPHL

tPLH, tPHL

74HC_HCT00_Q100

Product data sheet

All information provided in this document is subject to legal disclaimers.

Rev. 2 — 24 November 2015

© Nexperia B.V. 2017. All rights reserved

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