SCAN182374A 查看數據表（PDF） - Fairchild Semiconductor

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SCAN182374A

D-Type Flip-Flop with 25Ω Series Resistor Outputs

Fairchild Semiconductor 

AC Operating Requirements

Scan Test Operation

VCC

TA = −40°C to +85°C

Symbol

Parameter

(V)

CL = 50 pF

Units

(Note 8)

Guaranteed Minimum

tS

Setup Time

Data to TCK (Note 9)

5.0

2.7

ns

tH

Hold Time

Data to TCK (Note 9)

5.0

3.1

ns

tS

Setup Time, H or L

AOE1, BOE1 to TCK (Note 10)

tH

Hold Time, H or L

TCK to AOE1, BOE1 (Note 10)

tS

Setup Time, H or L

Internal AOE, BOE to TCK (Note 11)

5.0

5.0

ns

5.0

1.8

ns

5.0

3.6

ns

tH

Hold Time, H or L

TCK to Internal AOE, BOE (Note 11)

5.0

2.1

ns

tS

Setup Time

ACP, BCP (Note 12) to TCK

5.0

3.4

ns

tH

Hold Time

TCK to ACP, BCP (Note 12)

5.0

1.8

ns

tS

Setup Time, H or L

TMS to TCK

5.0

8.7

ns

tH

Hold Time, H or L

TCK to TMS

5.0

1.8

ns

tS

Setup Time, H or L

TDI to TCK

5.0

6.4

ns

tH

Hold Time, H or L

TCK to TDI

5.0

3.2

ns

tW

Pulse Width TCK

H

8.2

5.0

ns

L

11.2

fMAX

Maximum TCK Clock Frequency

tPU

Wait Time, Power Up to TCK

tDN

Power Down Delay

Note 8: Voltage Range 5.0V ± 0.5V

5.0

50

MHz

5.0

100

ns

0.0

100

ms

Note 9: This delay represents the timing relationship between the data input and TCK at the associated scan cells numbered 0–8, 9–17, 18–26 and 27–35.

Note 10: Timing pertains to BSR 38 and 41 only.

Note 11: This delay represents the timing relationship between AOE/BOE and TCK for scan cells 36 and 39 only.

Note 12: Timing pertains to BSR 37 and 40 only.

Note: All Input Timing Delays involving TCK are measured from the rising edge of TCK.

Capacitance

TA = 25°C

Symbol

Parameter

Typ

CIN

Input Capacitance

5.8

COUT (Note 13) Output Capacitance

13.8

Note 13: COUT is measured at frequency f = 1 MHz, per MIL-STD-883B, Method 3012.

Units

pF

pF

VCC = 0.0V

VCC = 5.0V

Conditions

11

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