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TDA1549T

Stereo 4fs data input up-sampling filter with bitstream continuous calibration DAC (BCC-DAC1)

Philips Electronics 

Philips Semiconductors

Stereo 4fs data input up-sampling filter with

bitstream continuous calibration DAC (BCC-DAC1)

Objective specification

TDA1549T

SYMBOL

PARAMETER

CONDITIONS

MIN.

TYP.

MAX. UNIT

Reference values

Vref

RCONV

reference voltage level

current-to-voltage conversion

resistance

2.45 2.5

1.6

2.2

2.55

V

2.8

kΩ

Analog outputs; pins VOL and VOR

RES

resolution

−

−

18

bit

VFS(rms)

full-scale output voltage (RMS value)

1.425 1.5

1.575

V

VOFF

output voltage DC offset with respect

to reference voltage level Vref

−80 −65

−50

mV

TCFS

full-scale temperature coefficient

−

±100 x 10−6 −

(THD + N)/S total harmonic distortion plus

at 0 dB input level;

−

−90

−83

dB

noise-to-signal ratio

note 6

−

0.003

0.007

%

at −60 dB input level; −

−48

note 7

−

0.40

at −60 dB input level; −

−50

A-weighted; note 8

−

0.32

−40

dB

1.0

%

−

dB

−

%

at 0 dB input level;

−

20 Hz to 20 kHz;

−

note 9

−90

0.003

−83

dB

0.007

%

S/N

signal-to-noise ratio at bipolar zero A-weighted;

100 110

−

dB

at code 00000H

tcs

αcs

|∆VO|

|ZO|

RL

CL

current setting time to ±1 LSB

channel separation

unbalance between outputs

dynamic output impedance

output load resistance

output load capacitance

−

0.1

85

100

−

0.2

−

10

3

−

−

−

−

ms

−

dB

0.3

dB

−

W

−

kΩ

200

pF

Notes

1. All VDD and VSS pins must be connected externally to the same supply.

2. Measured with VDDD = VDDA = VDDO = 5 V at input data code 00000H.

3. Measured with VDDD = VDDA = VDDO = 3.8 V at input data code 00000H.

4. Vripple = 1% of the supply voltage and fripple = 100 Hz. Ripple rejection RR to VDDA is dependent on the value of the

external capacitor (CEXT3 in Fig.1) connected to Vref. The value quoted here assumes CEXT3 = 1 µF.

5. Around multiples of 4fs.

6. Measured with a 1 kHz, 0 dB, 18-bit sine wave generated at a sampling rate of 192 kHz.

(THD + N)/S measured over a bandwidth from 20 Hz to 20 kHz.

7. Measured with a 1 kHz, −60 dB, 18-bit sine wave generated at a sampling rate of 192 kHz. (THD + N)/S measured

over a bandwidth from 20 Hz to 20 kHz.

8. Measured with a 1 kHz, −60 dB, 18-bit sine wave generated at a sampling rate of 192 kHz.

(THD + N)/S measured over a bandwidth from 20 Hz to 20 kHz and filtered with A-weighted characteristic.

9. Measured with a 0 dB, 18-bit sine wave from 20 Hz to 20 kHz generated at a sampling rate of 192 kHz. (THD + N)/S

measured over a bandwidth from 20 Hz to 20 kHz.

August 1994

11

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