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AT27BV800(2000) 查看數據表(PDF) - Atmel Corporation

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AT27BV800 Datasheet PDF : 12 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
BYTE Transition AC Waveforms
A0 - A18
A-1
BYTE/VPP
O0 - O7
O8 - O15
tOH
tSTD
VALID
VALID
tACC
tOH
tST
DATA OUT
HI-Z
DATA OUT
DATA OUT
Notes: 1. Timing measurement references are 0.8V and 2.0V. Input AC drive levels are 0.45V and 2.4V, unless otherwise specified.
2. OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE.
3. OE may be delayed up to tACC - tOE after the address is valid without impact on tACC.
4. This parameter is only sampled and is not 100% tested.
5. Output float is defined as the point when data is no longer driven.
Input Test Waveforms and Measurement Levels
Output Test Load
tR, tF < 20 ns (10% to 90%)
Note: CL = 100 pF including jig
capacitance.
Pin Capacitance
f = 1 MHz, T = 25°C(1)
Symbol
Typ
Max
Units
CIN
COUT
Note:
4
10
pF
8
12
pF
1. Typical values for nominal supply voltage. This parameter is only sampled and is not 100% tested.
6
AT27BV800
Conditions
VIN = 0V
VOUT = 0V

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