Philips Semiconductors
8-bit latched/registered/pass-thru
Futurebus+ universal interface transceiver
Product specification
FB2033
AC ELECTRICAL CHARACTERISTICS (Continued)
B PORT LIMITS
SYMBOL
PARAMETER
TEST
CONDITION
Tamb = +25°C, VCC = 5V,
CD = 30pF, RU = 9Ω
MIN TYP MAX
Tamb = 0 to 70°C,
VCC = 5V±10%,
CD = 30pF, RU = 9Ω
MIN
MAX
UNIT
tPLH
Propagation delay (thru mode)
tPHL
AIn to Bn
Waveform 1, 2
1.2
2.9
4.3
1.0
2.9
4.4
1.0
1.0
4.8
4.6
ns
tPLH
Propagation delay (transparent latch)
tPHL
AIn to Bn
Waveform 1, 2
1.4
3.1
4.5
1.0
3.3
4.8
1.0
1.0
5.1
5.1
ns
tPLH
Propagation delay
tPHL
LCAB to Bn
Waveform 1, 2
2.7
4.4
5.7
2.2
5.1
6.6
2.4
2.0
6.4
7.1
ns
tPLH
Propagation delay
tPHL
SABn to Bn
Waveform 1, 2
1.8
3.6
5.0
1.0
3.3
4.9
1.4
1.0
5.7
5.2
ns
tPZH
Enable/disable time
tPZL
OEB0 or OEB1 to Bn
Waveform 1, 2
1.4
3.0
4.5
1.0
3.1
5.0
1.0
1.0
5.0
5.6
ns
∆V/∆t
Output transition rate, Bn Port
20% to 80%, 80% to 20%
Test Circuit and
Waveforms
0.4
1.2
V/ns
tSK(o) Output to output skew, B port 1
Waveform 3
0.8
1.5
2.0
ns
tSK(p)
Pulse skew 2
tPHL – tPLH MAX
Waveform 2
0.3
1.5
ns
SYMBOL
PARAMETER
TEST CONDITION
RU = 16.5Ω
RU = 16.5Ω
UNIT
tPLH
Propagation delay (thru mode)
tPHL
AIn to Bn
Waveform 1, 2
1.2
3.0
4.4
1.0
3.0
4.5
1.0
1.0
4.9
4.7
ns
tPLH
Propagation delay (transparent latch)
tPHL
AIn to Bn
Waveform 1, 2
1.4
3.2
4.6
1.0
3.4
4.9
1.0
1.0
5.2
5.2
ns
tPLH
Propagation delay
tPHL
LCAB to Bn
Waveform 1, 2
2.7
4.5
5.8
2.2
5.2
6.7
2.4
2.0
6.5
7.2
ns
tPLH
Propagation delay
tPHL
SABn to Bn
Waveform 1, 2
1.8
3.7
5.1
1.0
3.4
5.0
1.4
1.0
5.8
5.3
ns
tPZH
Enable/disable time
tPZL
OEB0 or OEB1 to Bn
Waveform 1, 2
1.4
3.1
4.6
1.0
3.2
5.1
1.0
1.0
5.1
5.7
ns
∆V/∆t
Output transition rate, Bn Port
20% to 80%, 80% to 20%
Test Circuit and
Waveforms
0.2
0.6
V/ns
tSK(o)
tSK(p)
Output to output skew, B port 1
Pulse skew 2
tPHL – tPLH MAX
Waveform 3
Waveform 2
0.5
1.0
0.3
1.0
1.5
ns
1.5
ns
NOTES:
1. tPNactual – tPMactual for any data input to output path compared to any other data input to output path where N and M are either LH or
HL. Skew times are valid only under same test conditions (temperature, VCC, loading, etc.).
2. tSK(p) is used to quantify duty cycle characteristics. In essence it compares the input signal duty cycle to the corresponding output signal
duty cycle (50MHz input frequency and 50% duty cycle, tested on data paths only).
1995 May 25
8