MC74VHC1GT66(2011) 查看數據表（PDF） - ON Semiconductor

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MC74VHC1GT66
(Rev.:2011)

SPST (NO) Normally Open Analog Switch

ON Semiconductor 

MC74VHC1GT66

Switch to Position 2 when testing tPLZ and tPZL

Switch to Position 1 when testing tPHZ and tPZH

VCC

1

2

VCC

1

2

TEST POINT

1

RL

2

CL*

3

VCC

5

4

*Includes all probe and jig capacitance.

N/C

1

N/C

2

3

VCC

A

5

4

Figure 8. Propagation Delay Output Enable/Disable

Test Set−Up

Figure 9. Power Dissipation Capacitance

Test Set−Up

0.1 mF

fin

dB

Meter

VOS

1

2

3

VIS

VOS

VCC

0.1 mF

5

fin

1

2

4

dB

Meter

RL

3

VCC

5

4

*Includes all probe and jig capacitance.

Figure 10. Maximum On−Channel Bandwidth

Test Set−Up

*Includes all probe and jig capacitance.

Figure 11. Off−Channel Feedthrough Isolation

Test Set−Up

RL

VOS

(VCC)/2

RL

1

IS

2

3

To Distortion

Meter

(VCC)/2

VIS

VCC

0.1 mF

5

RL

fin

1

VIN v 1 MHz

VOS

tr + tf + 2 ns

2

4

VIH

3

GND

VCC

5

VIH

4

*Includes all probe and jig capacitance.

*Includes all probe and jig capacitance.

Figure 12. Feedthrough Noise, ON/OFF Control to

Analog Out, Test Set−Up

Figure 13. Total Harmonic Distortion Test Set−Up

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