MC14512 查看數據表（PDF） - ON Semiconductor

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MC14512

8-Channel Data Selector

ON Semiconductor 

PULSE

GENERATOR

PULSE

GENERATOR

VDD

S3

S4

VSS

MC14512B

VDD

DISABLE

INHIBIT

A

B

C

X0

X1

X2

X3

X4

X5

X6

X7

Z

CL

VSS

Parameter

Inhibit to Z

A, B, C to Z

20 ns

20 ns

DATA

tPLH

Z

90%

50%

10%

90%

50%

10%

tTLH

VDD

VSS

tPHL

VOH

VOL

tTHL

TEST CONDITIONS:

INHIBIT = VSS

A, B, C = VSS

20 ns

INHIBIT,

A, B, OR C

Test Conditions

A, B, C = VSS, XO = VDD

tPHL

Z

90%

50%

10%

90%

50%

10%

Inh = VSS, XO = VDD

tTHL

20 ns

VDD

VSS

tPLH VOH

VOL

tTLH

Figure 2. AC Test Circuit and Waveforms

VDD

DISABLE

INHIBIT

A

B

C

X0

X1

X2

X3

X4

X5

X6

X7

Z

CL

1k

VSS

VDD

S1

S2

VSS

20 ns

DISABLE

INPUT

tPLZ

OUTPUT

tPHZ

OUTPUT

90%

50%

10%

10%

90%

Switch Positions for 3–State Test

Test S1

S2

S3

S4

tPHZ Open Closed Closed Open

tPLZ Closed Open Open Closed

tPZL Closed Open Open Closed

tPZH Open Closed Closed Open

20 ns

VDD

VSS

tPZL

90% VOH

VOL

tPZH

VOH

10% VOL

≈ 2.5 V @ VDD = 5 V,

10 V, AND 15 V

≈ 2 V @ VDD = 5 V

≈ 6 V @ VDD = 10 V

≈ 10 V @ VDD = 15 V

Figure 3. 3–State AC Test Circuit and Waveform

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