DS1004M-3 查看數據表（PDF） - Dallas Semiconductor -> Maxim Integrated

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DS1004M-3

5-Tap High-Speed Silicon Delay Line

Dallas Semiconductor -> Maxim Integrated 

DS1004 TEST CIRCUIT Figure 1

DS1004

TEST SETUP DESCRIPTION

Figure 1 illustrates the hardware configuration used for measuring the timing parameters of the DS1004.

The input waveform is produced by a precision pulse generator under software control. Time delays are

measured by a time interval counter (20 ps resolution) connected to the output. The DS1004 output taps

are selected and connected to the interval counter by a VHF switch control unit. All measurements are

fully automated with each instrument controlled by the computer over an IEEE 488 bus.

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