ADM1186-1ARQZ 查看數據表（PDF） - Analog Devices

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ADM1186-1ARQZ

Quad Voltage Up and Down Sequencer and Monitor with Programmable Timing

Analog Devices 

Data Sheet

ADM1186

Parameter

Min

Typ

Max

Unit Test Conditions/Comments

SEQ_DONE PIN

Output Low Voltage, VSEQ_DONEL

0.4

V

VVCC = 2.7 V, ISINK = 2 mA

Leakage Current

1

µA

SEQ_DONE = 5.5 V

VVCC That Guarantees Valid Outputs

1

V

Output is guaranteed to be either low (VSEQ_DONEL = 0.4 V)

or giving a valid output level from VVCC = 1 V, ISINK = 30 µA

or VVCC = 1.1 V, ISINK = 100 µA

RESPONSE TIMING

Includes input glitch filter and all other internal

delays

VINx to PWRGD

VINx Going Low to High

21.9

28.8

35.2

µs

50 mV input overdrive

VINx Going High to Low

5.8

7.3

8.9

µs

50 mV input overdrive

VINx to FAULT, OUTx Low

VINx Going High to Low (UV Fault) 6.1

7.5

9.2

µs

50 mV input overdrive

UP, DOWN, and UP/DOWN to FAULT, 5.5

8.6

12.1

µs

100 mV input overdrive

OUTx Low, tUDOUT

5.8

7.7

10.5

µs

1 V input overdrive

External FAULT to OUTx Low

10

µs

1 V input overdrive

Fault Hold Time

35

44

54

µs

UP, UP/DOWN held low

1 Input comparators do not include hysteresis on their inputs. The comparator output passes through a digital glitch filter to remove short transients from the input

signal that would otherwise drive the state machine.

Rev. B | Page 5 of 28

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