N74F189AD 查看數據表（PDF） - Philips Electronics
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N74F189AD Datasheet PDF : 10 Pages
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Philips Semiconductors
64-bit TTL bipolar RAM, inverting (3-State)
Product specification
74F189A
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
UNIT
MIN
NOM
MAX
TA = –40 to +85°C
VCC
Supply voltage
4.5
5.0
5.5
V
VIH
High–level input voltage
2.0
V
VIL
Low–level input voltage
0.8
V
IIk
Input clamp current
–18
mA
IOH
High–level output current
–3
mA
IOL
Low–level output current
24
mA
Tamb
Operating free air temperature range
0
+70
°C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
UNIT
MIN TYP2 MAX
VOH High-level output voltage
VCC = MIN, VIL = MAX
VIH = MIN, IOH = MAX
VOL
Low-level output voltage
VCC = MIN, VIL = MAX
VIH = MIN, IOL = MAX
VIK
Input clamp voltage
VCC = MIN, II = IIK
II
Input current at maximum input voltage VCC = MAX, VI = 7.0V
IIH
High–level input current
IIL
Low–level input current
others
CE, WE
VCC = MAX, VI = 2.7V
VCC = MAX, VI = 0.5V
±10%VCC
2.4
±5%VCC
2.7
±10%VCC
±5%VCC
V
3.4
V
0.35 0.50
V
0.35 0.50
V
-0.73 -1.2
V
100
µA
20
µA
-0.6 mA
-1.2 mA
IOZH
Offset output current,
high–level voltage applied
VCC = MAX, VI = 2.7V
50
µA
IOZL
Offset output current,
low–level voltage applied
VCC = MAX, VI = 0.5V
–50
µA
IOS
Short-circuit output current3
VCC = MAX
-60
-150 mA
ICC
Supply current (total)
VCC = MAX, CE = WE = GND
55
80
mA
CIN
Input capacitance
VCC = 5V, VIN = 2.0V
4
pF
COUT Output capacitance
VCC = 5V, VOUT = 2.0V
7
pF
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
1990 Feb 23
4
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