100331 查看數據表（PDF） - Fairchild Semiconductor

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产品描述 (功能)

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100331

Low Power Triple D-Type Flip-Flop

Fairchild Semiconductor 

Test Circuits

FIGURE 1. AC Test Circuit

Notes:

VCC, VCCA = +2V, VEE = −2.5V

L1 and L2 = Equal length 50Ω impedance lines

RT = 50Ω terminator internal to scope

Decoupling 0.1 µF from GND to VCC and VEE

All unused outputs are loaded with 50Ω to GND

CL = Fixture and stray capacitance ≤ 3 pF

FIGURE 2. Toggle Frequency Test Circuit

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