STQ-1016Z 查看數據表（PDF） - Unspecified
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STQ-1016Z Datasheet PDF : 9 Pages
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STQ-2016Z Reliability Qualification Report
XII. Junction Temperature Determination
One key issue in performing qualification testing is to accurately determine the junction
temperature of the device. Sirenza Microdevices uses a 3um spot size emissivity
corrected infrared camera measurement to resolve the surface temperature of the device
at the maximum operational power dissipation. The results are displayed below for the
STQ-2016Z device running at operational current of Id= 80mA, a device voltage of 5V,
and lead temperature of 85°C.
Figure 2: Infrared Thermal Image of STQ-2016Z, Vd = 5.0V, Id =80mA, Tj = 98°C
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