74VHCT03ATTR 查看數據表（PDF） - STMicroelectronics

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74VHCT03ATTR

QUAD 2-INPUT OPEN DRAIN NAND GATE

STMicroelectronics 

74VHCT03A

DYNAMIC SWITCHING CHARACTERISTICS

Test Condition

Value

Symbol

Parameter

VCC

(V)

TA = 25°C

-40 to 85°C -55 to 125°C Unit

Min. Typ. Max. Min. Max. Min. Max.

VOLP Dynamic Low

Voltage Quiet

5.0

VOLV Output (note 1, 2)

0.3 0.8

-0.8 -0.3

Dynamic High

VIHD Voltage Input

5.0

CL = 50 pF

2.0

V

(note 1, 3)

Dynamic Low

VILD Voltage Input

5.0

0.8

(note 1, 3)

1) Worst case package.

2) Max number of outputs defined as (n). Data inputs are driven 0V to 3.0V, (n-1) outputs switching and one output at GND.

3) Max number of data inputs (n) switching. (n-1) switching 0V to 3.0V. Inputs under test switching: 3.0V to threshold (VILD), 0V to threshold

(VIHD), f=1MHz.

TEST CIRCUIT

CL =15/50pF or equivalent (includes jig and probe capacitance)

RL = R1 = 1KΩ or equivalent

RT = ZOUT of pulse generator (typically 50Ω)

4/8

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