HD74BC563A 查看數據表（PDF） - Hitachi -> Renesas Electronics
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HD74BC563A Datasheet PDF : 9 Pages
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Switching Test Method (CL = 50 pF)
Item
Propagation
delay time
D→Q
LE → Q
Output enable time
Output disable time
Setup time
Hold time
Pulse width
Input capacitance
Output capacitance
Symbol
t PLH
t PHL
t PLH
t PHL
t ZH
t ZL
t HZ
t LZ
tS(H)
tS(L)
th(H)
th(L)
tw
CIN
CO
Ta = 25°C
VCC = 5.0 V
Min
Max
3.0
8.0
3.0
8.0
3.0
8.0
3.0
8.0
3.0
9.0
3.0
9.0
3.0
8.0
3.0
8.0
2.0
—
2.0
—
2.0
—
2.0
—
6.0
—
3.0(Typ)
15.0(Typ)
HD74BC563A
Ta = –40 to 85°C
VCC = 5.0 V ±10%
Min
Max
3.0
10.0
3.0
10.0
3.0
10.0
3.0
10.0
3.0
11.0
3.0
11.0
3.0
10.0
3.0
10.0
2.0
—
2.0
—
2.0
—
2.0
—
6.0
—
—
—
Unit Test Conditions
ns See under figure
ns
ns
ns
ns
ns
ns
pF VIN = VCC or GND
pF VO = VCC or GND
Test Circuit
VCC
Input
Pulse Generator
Zout = 50 Ω
Input
Pulse Generator
Zout = 50 Ω
VCC
OC
Output
1D to 8D
1Q to 8Q
C L=
LE
50 pF
500 Ω
450 Ω
50 Ω Scope
Notes:
1. CL includes probe and jig capacitance.
2. OPEN: tPLH, tPHL, tZH, tHZ, th, ts, tw
7V: tZL, tLZ
*2
OPEN
7V
5
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