TC4011B Просмотр технического описания (PDF) - Toshiba

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TC4011B

Quad 2 Input NAND Gate

Toshiba 

TC4011BP/BF/BFT

Dynamic Electrical Characteristics (Ta = 25°C, VSS = 0 V, CL = 50 pF)

Characteristics

Output transition time

Output transition time

Propagation delay time

Propagation delay time

Input capacitance

Symbol

tTLH

tTHL

tpLH

tpHL

CIN

Test Condition

―

―

―

―

―

Min Typ. Max Unit

VDD (V)

5

―

70 200

10

―

35 100 ns

15

―

30

80

5

―

70 200

10

―

35 100 ns

15

―

30

80

5

―

65 200

10

―

30 100 ns

15

―

25

80

5

―

65 200

10

―

30 100 ns

15

―

25

80

―

5

7.5

pF

Circuit and Waveform for Measurement of Dynamic Characteristics

Circuit

Waveform

20 ns

20 ns

P.G.

Input

VDD

Output

CL = 50 pF

VSS

Input

Output

90%

50%

10%

90%

50%

10%

tTHL

tTLH

90%

50%

10%

90%

50%

10%

tpHL

tpLH

4

2012-02-29

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