WM8786
Production Data
ELECTRICAL CHARACTERISTICS
Test Conditions
DVDD = 3.3V, AVDD = 5.0V, TA = +25oC, 1kHz signal, A-weighted, fs = 48kHz, MCLK = 256fs, 24-bit audio data, Slave Mode
unless otherwise stated.
PARAMETER
SYMBOL TEST CONDITIONS
MIN
TYP
MAX
UNIT
ADC Performance
Full Scale Input Signal Level
(for ADC 0dB Input)
2.0
Vrms
Input resistance
10
kΩ
Input capacitance
10
pF
Signal to Noise Ratio (Note
SNR
A-weighted,
102
111
dB
1,2,4)
@ fs = 48kHz
Unweighted,
108
dB
@ fs = 48kHz
Signal to Noise Ratio (Note
SNR
A-weighted,
111
dB
1,2,4)
@ fs = 96kHz
Unweighted,
108
dB
@ fs = 96kHz
Signal to Noise Ratio (Note
SNR
A-weighted,
111
dB
1,2,4)
@ fs = 192kHz
Unweighted,
108
dB
@ fs = 192kHz
Total Harmonic Distortion
THD
1kHz, -0.1dB Full Scale
@ fs = 48kHz
-102
-92
dB
1kHz, -0.1dB Full Scale
-102
dB
@ fs = 96kHz
1kHz, -0.1dB Full Scale
-102
dB
@ fs = 192kHz
Total Harmonic Distortion
THD
1kHz, -0.1dB Full Scale
@ fs = 48kHz
0.0008
0.0025
%
1kHz, -0.1dB Full Scale
0.0008
%
@ fs = 96kHz
1kHz, -0.1dB Full Scale
0.0008
%
@ fs = 192kHz
Dynamic Range
DNR
-60dBFS
102
111
dB
Channel Level Matching
20kHz signal
0.1
dB
Power Supply Rejection Ratio
PSRR 1kHz 100mVpp, applied
50
dB
to AVDD, DVDD
20Hz to 20kHz
45
dB
100mVpp
Digital Logic Levels (CMOS Levels)
Input LOW level
VIL
Input HIGH level
VIH
Input leakage current
0.3 x DVDD
V
0.7 x DVDD
V
-1
±0.2
+1
µA
Input capacitance
5
pF
Output LOW
VOL
IOL=1mA
0.1 x DVDD
V
Output HIGH
VOH
IOH= -1mA
0.9 x DVDD
V
Analogue Reference Levels
Midrail Reference Voltage
Potential Divider Resistance
VMID
AVDD to VMID and
–3%
AVDD/2
+3%
V
VMID to VREFGND
RVMID
AVDD to VMID and
50
kΩ
VMID to GND
Buffered Reference Voltage
VREF
–3% 0.8 x AVDD +3%
V
w
PD Rev 4.2 February 2007
6