TLP117 Просмотр технического описания (PDF) - Toshiba

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TLP117

TOSHIBA PHOTOCOUPLER GaAℓAs LED & PHOTO-IC

Toshiba 

TLP117

TEST CIRCUIT 6 : tpHL , tpLH

INPUT MONITORING NODE

VIN=1.1↔5V(P.G)

(f=25MHz , duty=50%)

VCC

*CL=15pF

CIN =22pF

SHIELD

RIN =360Ω

GND

tr=4.5ns

0.1μF

Vo

MONITORING

NODE

VIN 10%

VCC

*CL=15pF

VO

90%

tf

CL is capacitance of the probe and JIG.

(P.G) : Pulse Generator

(example for LED drive circuit)

tpHL

tf=4.5ns

50%

VL=1.1V

GND

tr

VOH

90%

50%

10% VOL

tpLH

CIN=22pF

CIN=47pF

INPUT MONITORING NODE CIN 22 F

f=25MHz

TC7SZ08F/FU RIN1=300Ω RIN2=180Ω

VCC

P.G

RIN3=1.6kΩ

GND

5V

VCC

GND

SHIELD

0.1μF

Vo

MONITORING

NODE

VCC

*CL=15pF

CL is capacitance of the probe and JIG.

(P.G) : Pulse Generator

TEST CIRCUIT 7 : Common-Mode Transient Immunity Test Circuit

SW

IF

→

A

B

1

6

VCC

5 0.1μF

VO

VCC

3

GND 4

SHIELD

VCM

90%

VCM 10%

tr

・SW B : IF=0mA

4V

・SW A : IF=10mA

1000V

tf

CMH

0.4V

CML

CM H

=

800(V )

t r (μs)

CM

L

=

−

800(V )

t f (μs)

6

2010-04-02

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