SSF1016
Qg Total gate charge
Qgs Gate-to-Source charge
Qgd Gate-to-Drain("Miller") charge
td(on) Turn-on delay time
tr Rise time
td(off) Turn-Off delay time
tf Fall time
Ciss Input capacitance
Coss Output capacitance
Crss Reverse transfer capacitance
— 90
— 20
ID=30A,VGS=10V
nC
—
VDD=30V
— 31 —
— 18.2
— 15.6
— 70.5
— 13.8
VDD=30V
ID=2A ,RL=15Ω
nS RG=2.5Ω
VGS=10V
— 3150
— 350
— 240
VGS=0V
pF VDS=25V
f=1.0MHZ
Source-Drain Ratings and Characteristics
Parameter
Min. Typ. Max. Units
Test Conditions
Continuous Source Current .
IS (Body Diode)
—
Pulsed Source Current
ISM (Body Diode) ①
.
—
VSD Diode Forward Voltage
—
trr Reverse Recovery Time
-
Qrr Reverse Recovery Charge
-
—
75
—
300
—
1.3
57
—
107
—
MOSFET symbol
showing the
A
integral reverse
p-n junction diode.
V TJ=25ْC,IS=60A,VGS=0V ③
nS TJ=25ْC,IF=75A
μC di/dt=100A/μs ③
ton Forward Turn-on Time
Intrinsic turn-on time is negligible (turn-on is dominated by Ls + LD)
Notes:
① Repetitive rating; pulse width limited by max junction temperature.
② Test condition: L =0.3mH, VDD = 50V,Id=37A
③ Pulse width≤300μS, duty cycle≤1.5% ; RG = 25Ω Starting TJ = 25°C
EAS Test Circuit:
Gate Charge Test Circuit:
©Silikron Semiconductor CO.,LTD.
2009.8.10
Version : 1.0
page 2of5