µPD98401A
1.5 JTAG Boundary Scan Pins
Pin Name
JDI
JDO
JCK
JMS
JRST_B
Pin No.
201
200
197
202
203
I/O
I
O
3-state
I
I
I
I/O Level
TTL
CMOS
TTL
TTL
TTL
Function
JTAG Test Data Input.
The JDI pin is used to input data to the JTAG boundary scan circuit
register.
Normally, fix this pin to high or low level.
JTAG Test Data Output.
The JDO pin is used to output data from the JTAG boundary scan
circuit register. It changes output at the falling edge of the clock input
to the JCK pin.
Normally, leave this pin open.
JTAG Test Clock.
This pin is used to supply a clock to the JTAG boundary scan circuit
register.
Normally, fix this pin to a high or low level.
JTAG Test Mode Select.
Normally, fix this pin to a high or low level.
JTAG Test Reset.
This pin initializes the JTAG boundary scan circuit register. Normally,
fix this pin to a low level.
1.6 Test Pin
Pin Name
Pin No.
I/O
I/O Level
Function
TRF_B
189
I
TTL
This pin is used to test the internal circuitry of the chip.
0: Normal operation
1: Test
Normally, directly connect this pin to ground and fix it to a low level.
1.7 Power Supply and Ground Pins
Pin Name
VDD
GND
Pin No.
15, 27, 30, 34, 41, 53, 58,
72, 78, 94, 104, 114, 124,
130, 142, 157, 165, 174,
183, 190, 195, 198, 204,
208
1, 2, 8, 14, 21, 26, 31, 33,
40, 51, 52, 59, 73, 79, 91,
93, 105 ,106, 115, 123,
131, 141, 150, 155, 156,
166, 175, 182, 191, 196,
199, 205
I/O
Function
Power supply (24 pins)
These 24 VDD pins supply a voltage of +5 V ± 5% to the chip.
Ground (32 pins)
Connect these pins to ground.
14
Data Sheet S12100EJ3V0DS00