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SI4735-D60-GM(2013) Просмотр технического описания (PDF) - Silicon Laboratories

Номер в каталоге
Компоненты Описание
производитель
SI4735-D60-GM
(Rev.:2013)
Silabs
Silicon Laboratories 
SI4735-D60-GM Datasheet PDF : 42 Pages
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Si4730/31/34/35-D60
Table 10. Reference Clock and Crystal Characteristics
(VA = 2.7 to 5.5 V, VD = 1.62 to 3.6 V, TA = –20 to 85 °C)
Parameter
RCLK Supported Frequencies1
RCLK Frequency Tolerance2
REFCLK_PRESCALE
REFCLK
Symbol Test Condition
Reference Clock
Min
Typ
Max
Unit
31.130 32.768 40,000 kHz
–100
100
ppm
1
4095
31.130 32.768 34.406 kHz
Crystal Oscillator Frequency
Crystal Frequency Tolerance2
Board Capacitance
ESR
CL3
CL–single ended3
Crystal Oscillator
32.768
kHz
–100
100
ppm
3.5
pF
50

7
12
22
pF
14
24
44
pF
Notes:
1. The Si473x-D60 divides the RCLK input by REFCLK_PRESCALE to obtain REFCLK. There are some RCLK
frequencies between 31.130 kHz and 40 MHz that are not supported. For more details, see Table 6 of “AN332: Si47xx
Programming Guide”.
2. A frequency tolerance of ±50 ppm is required for FM seek/tune using 50 kHz channel spacing and AM seek/tune in SW
frequencies.
3. Guaranteed by characterization.
Table 11. Thermal Conditions
Parameter
Symbol
Min
Typ
Max
Thermal Resistance*
JA
80
Ambient Temperature
TA
–20
25
85
Junction Temperature
TJ
92
*Note: Thermal resistance assumes a multi-layer PCB with the exposed pad soldered to a topside PCB pad.
Unit
°C/W
°C
°C
16
Rev. 1.2

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