General Information
Table of Contents
Page
6.8 Test Mode ................................................................................................................. 68
6.7 Special RTS Function ............................................................................................... 68
7
Operational Description ......................................................................................... 69
7.1 RESET ...................................................................................................................... 69
7.2 Initialization ............................................................................................................... 70
7.3 Operational Phase .................................................................................................... 71
7.4 Data Transmission .................................................................................................... 71
7.5 Data Reception ......................................................................................................... 75
8
Detailed Register Description................................................................................ 79
8.1 Register Address Arrangement ................................................................................. 79
8.2 Register Definitions ................................................................................................... 80
9
Electrical Characteristics ..................................................................................... 108
10 Quartz Specifications ........................................................................................... 118
11 Package Outlines .................................................................................................. 125
Semiconductor Group
4