74F225 Просмотр технического описания (PDF) - Philips Electronics
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74F225 Datasheet PDF : 14 Pages
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Philips Semiconductors
16 × 5 asynchronous FIFO (3-State)
Product specification
74F225
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
UNIT
MIN TYP2 MAX
IR, OR,
VOH High-level output voltage UNCPOUT
Data
outputs
VOL Low-level output voltage
VIK
Input clamp voltage
II
Input current at maximum input voltage
VCC = MIN, VIL = MAX
VIH = MIN, IOH = MAX
VCC = MIN, VIL = MAX
VIH = MIN, IOH = MAX
VCC = MIN, VIL = MAX
VIH = MIN, IOL = MAX
VCC = MIN, II = IIK
VCC = MAX, VI = 7.0V
±10%VCC
2.5
±5%VCC
2.7
±10%VCC
2.4
±5%VCC
2.7
±10%VCC
±5%VCC
V
V
V
V
0.35
0.50
V
0.35
0.50
V
-0.73 -1.2
V
100
µA
IIH
High–level input current
VCC = MAX, VI = 2.7V
20
µA
IIL
IOZH
Low–level input current
Offset–output current,
High–level voltage applied
VCC = MAX, VI = 0.5V
VCC = MAX, VI = 2.7V
–20
µA
50
µA
IOZL
Offset–output current,
Low–level voltage applied
VCC = MAX, VI = 0.5V
–50
µA
IOS
Short-circuit output current3
VCC = MAX
-60
-150 mA
ICC
Supply current (total)
VCC = MAX
65
95
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of High-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
June 15, 1992
6
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