M74HCT75B1R Просмотр технического описания (PDF) - STMicroelectronics

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Компоненты Описание

производитель

M74HCT75B1R

4 BIT D TYPE LATCH

STMicroelectronics 

M74HCT75

CAPACITIVE CHARACTERISTICS

Test Condition

Value

Symbol

Parameter

VCC

(V)

TA = 25°C

-40 to 85°C -55 to 125°C Unit

Min. Typ. Max. Min. Max. Min. Max.

CIN Input Capacitance

5 10

10

10 pF

CPD Power Dissipation

Capacitance (note

61

pF

1)

1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without

load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC

TEST CIRCUIT

CL = 50pF or equivalent (includes jig and probe capacitance)

RT = ZOUT of pulse generator (typically 50Ω)

WAVEFORM : PROPAGATION DELAY TIMES, MINIMUM PULSE WIDTH, SETUP AND HOLD TIMES

(f=1MHz; 50% duty cycle)

5/9

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