M27V102
Table 7. Read Mode DC Characteristics (1)
(TA = 0 to 70 °C or –40 to 85 °C; VCC = 3.3V ± 10%; VPP = VCC)
Symbol
Parameter
Test Condition
Min
ILI
Input Leakage Current
IL O
Output Leakage Current
ICC
Supply Current
0V ≤ VIN ≤ VCC
0V ≤ VOUT ≤ VCC
E = VIL, G = VIL, IOUT = 0mA,
f = 5MHz, VCC ≤ 3.6V
ICC1 Supply Current (Standby) TTL
E = VIH
ICC2
Supply Current (Standby)
CMOS
E > VCC – 0.2V, VCC ≤ 3.6V
IPP
Program Current
VPP = VCC
VIL
VIH (2)
Input Low Voltage
Input High Voltage
–0.3
2
VOL Output Low Voltage
IOL = 2.1mA
VOH
Output High Voltage TTL
Output High Voltage CMOS
IOH = –400µA
IOH = –100µA
2.4
VCC – 0.7V
Notes: 1. VCC must be applied simultaneously with or before VPP and removed simultaneously or after VPP.
2. Maximum DC voltage on Output is VCC +0.5V
Max
±10
±10
15
1
20
10
0.8
VCC + 1
0.4
Unit
µA
µA
mA
mA
µA
µA
V
V
V
V
V
Table 8A. Read Mode AC Characteristics (1)
(TA = 0 to 70 °C or –40 to 85 °C; VCC = 3.3V ± 10%; VPP = VCC)
Symbol Alt
Parameter
Test Condition
M27V102
-90 (3)
-100
Min Max Min Max
tAVQV tACC Address Valid to Output Valid
E = VIL, G = VIL
90
100
tELQV
tCE Chip Enable Low to Output Valid
G = VIL
90
100
tGLQV
tEHQZ (2)
tGHQZ (2)
tOE Output Enable Low to Output Valid
tDF Chip Enable High to Output Hi-Z
tDF Output Enable High to Output Hi-Z
E = VIL
G = VIL
E = VIL
45
50
0
30
0
30
0
30
0
30
tAXQX
tOH Address Transition to Output Transition E = VIL, G = VIL 0
0
Notes: 1. VCC must be applied simultaneously with or before VPP and removed simultaneously with or after VPP.
2. Sampled only, not 100% tested.
3. Speed obtained with High Speed AC measurement conditions.
Unit
ns
ns
ns
ns
ns
ns
5/15