EVERLIGHT ELECTRONICS CO.,LTD.
Reliability Test Items and Results
EHP-A08L/SUR01-P01
Stress Test
Solderability
Resistance to Solder Heat
Thermal Shock
Temperature Cycle
Stress Condition
Tsol=230℃, 5sec
Tsol=260℃, 10sec, 6min
H:+110℃ 20min.
'∫ 10sec.
'L:- 40℃ 20min.
H:+100℃ 30min.
'∫ 5min.
'L:- 40℃ 30min.
Stress Duration
1 times
3 times
500 Cycles
1000 Cycles
High Temperature/Humidity
Reverse Bias
High Temperature/Humidity
Operation
High Temperature Storage
Low Temperature Storage
Ta=85℃ , RH=85%
Ta=85℃ , RH=60%, IF=225mA
Ta=110℃
Ta=-40℃
1000hours
1000hours
1000hours
1000hours
Intermittent operational Life
High Temperature Operation
Life #1
High Temperature Operation
Life #2
Ta=25℃, IF=1000mA
30mS on/ 2500mS off
Ta=55℃, IF=350mA
Ta=85℃, IF=225mA
1000hours
1000hours
1000hours
High Temperature Operation
Life #3
Ta=100℃, IF=150mA
Low Temperature Operation
Life
Power Temperature Cycle
ESD Human Body Model
Ta=-40℃, IF=350mA
H:+85℃ 15min.
'∫ 5min.
'L:- 40℃ 15min.
IF=225mA,2min on/off
2000V, Interval:0.5sec
ESD Machine Model
200V, Interval:0.5sec
*lm: BRIGHTNESS ATTENUATE DIFFERENCE(1000hrs)<50%
*VF: FORWARD VOLTAGE DIFFERENCE<20%
1000hours
1000hours
1000cycles
3 times
3 times
Everlight Electronics Co., Ltd.
Device No. : DSE-8L1-002
http://www.everlight.com
Prepared date: Nov 17, 2006
Rev. 3.0
Page: 8 of 11
Prepared by: Anita Chen