CXD3609R Просмотр технического описания (PDF) - Sony Semiconductor

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производитель

CXD3609R

Timing Generator for Progressive Scan CCD Image Sensor

Sony Semiconductor 

CXD3609R

VR and HR phase characteristics

VR

0.2VDDc

ts1

HR

th1

0.2VDDc

0.2VDDc

(Within the recommended operating conditions)

Symbol

ts1

th1

Definition

VR setup time, activated by the falling edge of HR

VR hold time, activated by the falling edge of HR

Min. Typ. Max. Unit

0

ns

0

ns

HR loading characteristics

HR

0.2VDDc

ts1

0.2VDDc

th1

MCKO

0.8VDDc

MCKO load capacitance = 10pF

(Within the recommended operating conditions)

Symbol

ts1

th1

Definition

HR setup time, activated by the rising edge of MCKO

HR hold time, activated by the rising edge of MCKO

Min. Typ. Max. Unit

13

ns

0

ns

Output variation characteristics

MCKO

0.8VDDc

WEN, ID/EXP

tpd1

WEN and ID/EXP load capacitance = 10pF

(Within the recommended operating conditions)

Symbol

Definition

Min. Typ. Max. Unit

tpd1

Time until the above outputs change after the rise of MCKO 20

60 ns

– 11 –

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