ADT7516/ADT7517/ADT7519
DAC Reference Inputs
There is an input reference pin for the DACs. This reference
input is buffered (see Figure 44).
The advantage with the buffered input is the high impedance it
presents to the voltage source driving it. The user can have an
external reference voltage as low as 1 V and as high as VDD. The
restriction of 1 V is due to the footroom of the reference buffer.
0.25°C change corresponding to 1 LSB change. The default
output resolution for the ADT7516 and ADT7517 is 8 bits. To
increase this to 10 bits, set C1 = 1 in the Control Configuration
3 register. The default output range is 0 V to VREF and this can be
increased to 0 V to 2 VREF. Increasing the output voltage span to
2 VREF can be done by setting D0 = 1 for DAC A (internal temp-
erature sensor) and D1 = 1 for DAC B (external temperature
sensor) in the DAC configuration register (Address 1Bh).
The LDAC configuration register controls the option to select
between internal and external voltage references. The default
setting is for external reference selected.
Output Amplifier
The output buffer amplifier can generate output voltages to
within 1 mV of either rail. Its actual range depends on the value
of VREF, gain, and offset error.
If a gain of 1 is selected (Bits 0 to 3 of the DAC configuration
register = 0), the output range is 0.001 V to VREF.
If a gain of 2 is selected (Bits 0 to 3 of the DAC configuration
register = 1), the output range is 0.001 V to 2 VREF. Because
of clamping, however, the maximum output is limited to
VDD – 0.001 V.
The output amplifier can drive a load of 4.7 kΩ to GND or VDD,
in parallel with 200 pF to GND or VDD (see Figure 5). The
source and sink capabilities of the output amplifier can be seen
in the plot of Figure 20.
The output voltage is capable of tracking a maximum temp-
erature range of –128°C to +127°C, but the default setting is
–40°C to +127°C. If the output voltage range is 0 V to VREF-IN
(VREF-IN = 2.25 V), then this corresponds to 0 V representing
–40°C, and 1.48 V representing +127°C. This, of course, will
give an upper deadband between 1.48 V and VREF.
The internal and external analog temperature offset registers
can be used to vary this upper deadband and, consequently, the
temperature that 0 V corresponds to. Table 6 and Table 7 give
examples of how this is done using a DAC output voltage span
of VREF and 2 VREF, respectively. Simply write in the temperature
value, in twos complement format, at which 0 V is to start. For
example, if using the DAC A output and 0 V to start at –40°C,
program D8h into the internal analog temperature offset reg-
ister (Address 21h). This is an 8-bit register and has a temp-
erature offset resolution of only 1°C for all device models. Use
the formulas following the tables to determine the value to
program into the offset registers.
Table 6. Thermal Voltage Output (0 V to VREF)
The slew rate is 0.7 V/µs with a half-scale settling time to
±0.5 LSB (at 8 bits) of 6 µs.
O/P Voltage (V) Default °C
0
–40
Max °C
–128
Sample °C
0
Thermal Voltage Output
The ADT7516/ADT7517/ADT7519 can output voltages that are
proportional to temperature. DAC A output can be configured
to represent the temperature of the internal sensor while DAC B
output can be configured to represent the external temperature
sensor. Bits C5 and C6 of the Control Configuration 3 register
select the temperature proportional output voltage. Each time a
temperature measurement is taken, the DAC output is updated.
The output resolution for the ADT7519 is 8 bits with 1°C
change corresponding to 1 LSB change. The output resolution
for the ADT7516 and ADT7517 are capable of 10 bits with
0.5
+17
–71
+56
1
+73
–15
+113
1.12
+87
–1
+127
1.47
+127
+39
UDB∗
1.5
UDB∗
+42
UDB∗
2
UDB∗
+99
UDB∗
2.25
UDB∗
+127
UDB∗
∗ Upper deadband has been reached. DAC output is not capable of
increasing. See Figure 9.
VDD
I
OPTIONAL CAPACITOR, UP TO
3nF MAX. CAN BE ADDED TO
IMPROVE HIGH FREQUENCY
NOISE REJECTION IN NOISY
ENVIRONMENTS
REMOTE
SENSING
TRANSISTOR
(2N3906)
D+
C1
D–
LOW-PASS
FILTER
fC = 65kHz
N× I
BIAS
DIODE
IBIAS
VOUT+
TO ADC
VOUT–
Figure 45. Signal Conditioning for External Diode Temperature Sensor
Rev. A | Page 21 of 44