AD5405 Просмотр технического описания (PDF) - Analog Devices

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AD5405

Dual 12-Bit, High Bandwidth, Multiplying DAC with 4-Quadrant Resistors and Parallel Interface

Analog Devices 

AD5405

ABSOLUTE MAXIMUM RATINGS

Transient currents of up to 100 mA do not cause SCR latch-up.

TA = 25°C, unless otherwise noted.

Table 3.

Parameter

VDD to GND

VREFA, VREFB, RFBA, RFBB to GND

IOUT1, IOUT2 to GND

Logic Inputs and Output1

Operating Temperature Range

Automotive (Y Version)

Storage Temperature Range

Junction Temperature

40-lead LFCSP, θJA Thermal Impedance

Lead Temperature, Soldering (10 sec)

IR Reflow, Peak Temperature (<20 sec)

Rating

−0.3 V to +7 V

−12 V to +12 V

−0.3 V to +7 V

−0.3 V to VDD + 0.3 V

−40°C to +125°C

−65°C to +150°C

150°C

30°C/W

300°C

235°C

1 Overvoltages at DBx, LDAC, CS, and R/W are clamped by internal diodes.

Stresses above those listed under Absolute Maximum Ratings

may cause permanent damage to the device. This is a stress

rating only; functional operation of the device at these or any

other conditions above those indicated in the operational

section of this specification is not implied. Exposure to absolute

maximum rating conditions for extended periods may affect

device reliability.

ESD CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on

the human body and test equipment and can discharge without detection. Although this product features

proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy

electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance

degradation or loss of functionality.

Rev. B | Page 6 of 24

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