N74F173N Просмотр технического описания (PDF) - Philips Electronics

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N74F173N

Quad D-type flip-flop (3-State)

Philips Electronics 

Philips Semiconductors

Quad D-type flip–flop (3-State)

Product specification

74F173

RECOMMENDED OPERATING CONDITIONS

SYMBOL

PARAMETER

VCC

VIH

VIL

IIk

IOH

IOL

Tamb

Supply voltage

High–level input voltage

Low–level input voltage

Input clamp current

High–level output current

Low–level output current

Operating free air temperature range

LIMITS

UNIT

MIN

NOM

MAX

4.5

5.0

5.5

V

2.0

V

0.8

V

–18

mA

–15

mA

48

mA

0

+70

°C

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

SYMBOL

PARAMETER

TEST

CONDITIONS1

LIMITS

UNIT

MIN TYP2 MAX

VCC = MIN, VIL = MAX,

±10%VCC 2.4

V

VOH

High-level output voltage

VIH = MIN, IOH = MAX

±5%VCC 2.7 3.4

V

VCC = MIN, VIL = MAX,

±10%VCC 2.0

V

VIH = MIN, IOH = –15mA

±5%VCC 2.0 3.1

V

VOL

Low-level output voltage

VIK

Input clamp voltage

II

Input current at maximum input voltage

IIH

High–level input current

IIL

Low–level input current

VCC = MIN, VIL = MAX,

VIH = MIN, IOL = MAX

VCC = MIN, II = IIK

VCC = MAX, VI = 7.0V

VCC = MAX, VI = 2.7V

VCC = MAX, VI = 0.5V

±10%VCC

±5%VCC

0.35 0.50 V

0.35 0.50 V

–0.73 -1.2 V

100 µA

20 µA

–0.6 mA

IOZH

Off–state output current, high–level voltage applied VCC = MAX, VO = 2.7V

50 µA

IOZL

Off–state output current, low–level voltage applied

VCC = MAX, VO = 0.5V

–50 µA

IOS

Short–circuit output current3

VCC = MAX

-60

-150 mA

ICCH

19 26 mA

ICC

Supply current (total)

ICCL VCC = MAX

27 37 mA

ICCZ

23 32 mA

Notes to DC electrical characteristics

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

2. All typical values are at VCC = 5V, Tamb = 25°C.

3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any

sequence of parameter tests, IOS tests should be performed last.

August 31, 1990

5

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